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高精度应变测量模块
主要特点
高达0.27%的精度
每通道高达80 kS/s的同步采样
高密度应变测量,提供16个通道
支持四分之一桥、半桥和全桥配置
提供5种增益选项,灵活调整
24位高分辨率ADC,确保测量精度
板载128 M样本FIFO缓冲器,数据存储无忧
桥路激励的远程感测功能,提高测量精度
硬件零点校准功能可在不损失动态范围的情况下将输入归零
可编程分流校准,可用于消除现场系统误差
支持模拟、数字和软件触发,以满足多样化的测试需求
产品介绍
JY-6313是一款高密度应变测量模块,专为精密应用设计,提供16个通道,支持四分之一桥、半桥和全桥配置。具有五种增益选项和24位高分辨率ADC,确保测量的准确性和可定制性。其板载128 M FIFO缓冲器支持大容量数据存储,同时桥路激励的远程感测提高了测量精度。硬件零点校准和可编程分流校准等附加功能消除了误差,提高了可靠性。它支持模拟、数字和软件触发,满足多种测试需求,并且兼容PXIe和PCIe平台,是多样化测试环境中的可靠选择。
PXIe-6313 (PN: JY9210887-01) | 16-ch, 80 kS/s, 24-Bit, PXIe Strain/Bridge Input Module
PCIe-6313 (PN: JY5954561-01) | 16-ch, 80 kS/s, 24-Bit, PCIe Strain/Bridge Input Module
USB-6313 (PN: JY8239874-01) | 16-ch, 80 kS/s, 24-Bit, USB Strain/Bridge Input Module
配件
ACL-1016868-1 (PN: JY7996916-01) | 1 M 68pin VHDC-SCSI twisted pair cable
ACL-1016868-2 (PN: JY7996916-02) | 2 M 68pin VHDC-SCSI twisted pair cable
TB-6313 (PN: JY8743398-01) | 8-ch for PCIe/PXIe-6313
RM-6313 (PN: JY9939593-01) | 32-ch for PCIe/PXIe-6313
Main Features
Up to 0.27% accuracy
Up to 80 kS/s per channel simultaneous sampling
High-density strain measurements, providing 16 channels
Support quarter, half and full bridge configuration
5 gain options, flexible adjustment
24-bit high-resolution ADC, ensuring accurate measurement
Onboard 128 M sample FIFO buffer, data storage is carefree
Bridge excitation remote sensing function, improve the measurement accuracy
Hardware offset nulling function allows zeroing the input without loss of dynamic range
Programmable shunt calibration can be used to eliminate system errors in the field
Analog, digital and software triggers to meet diverse testing requirements
Overview
The JY-6313 is a high-density strain measurement module designed for precision applications, offering 16 channels and supporting quarter, half, and full bridge configurations. With five gain options and a 24-bit high-resolution ADC, it ensures accurate and customizable measurements. Its onboard 128M FIFO buffer allows extensive data storage, while remote sensing for bridge excitation improves accuracy. Additional features like hardware offset nulling and programmable shunt calibration eliminate errors, enhancing reliability. It supports analog, digital, and software triggers for versatile testing needs, and is compatible with both PXIe and PCIe platforms, making it a robust choice for diverse testing environments.




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